Advanced top to bottom ED-XRF Machine with high-resolution Silicon Drift Detector ( SDD) .
The Goldscope SD 600 provides an alll-in-one solutions for precious metal analysis and coating thickness
measurement, Multi-Layer Thickness Measurement , Solution Analysis and Alloy composition. High resolution Silicon Drift Detector with large aperture (Ø3 mm, 118 mils) enables Goldscope SD 600 to achieve highest accuracy with a short measurement time.
Opening a new hallmarking centre? Find out how FISCHER can help in that?
The advanced top source XRF with DPP+