Goldscope SD 600 - DPP +

Advanced top to bottom ED-XRF Machine with high-resolution Silicon Drift Detector ( SDD) .

The Goldscope SD 600  provides an alll-in-one solutions for precious metal analysis and coating thickness

measurement, Multi-Layer Thickness Measurement , Solution Analysis and Alloy composition. High resolution Silicon Drift Detector with large aperture (Ø3 mm, 118 mils) enables Goldscope SD 600 to achieve highest accuracy with a short measurement time.

Application

• Jeweller, precious metals & dental alloys Precious Metal Analysis eg. Gold, Silver and Platinum group elements
• Measuring coating thickness on sterling silver, rhodium finishes or gold alloys
• Determination of complex multi layer-coating system 
• Platinum, Yellow , white gold , Rhodium and silver 
• Solutions for refineries, tunch assay offices and hallmarking Detection of PGM Group elements such as Iridium, Ruthenium, Osmium, Rhenium enabling an accurate precious metal analysis results.
• Materials analysis of coatings and alloys (also thin coatings and low concentrations)

 Features

• Detector :  Silicon Drift Detector ( SDD ) 20 mm ( 160 eV ) /  SDD detector with 50 mm ( 140 eV )
• Aperture (Collimator) : 4x changeable: Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 0.6 mm (23.6 mils), slot 0.5 x 0.15 mm (19.7 x 5.9 mils)
• Element range : Aluminium (13) to Uranium (92) – up to 24 elements simultaneously
• Design: Bench top unit with upward opening hood, Top to bottom X-Ray
• Repeatability : ≤ 0.5 ‰ for gold
• Measurement time :  15 seconds
• DPP+ for highly precise and fast anlysis of precious metals