X-RAY FLUORESCENCE analysis has its basis in the phenomenon that, when atoms in a material sample are excited by the primary X-radiation, electrons from the innermost shells are released; the resultant vacancies are then filled by electrons from the outer shells.
X-Ray Fluorescence Analysis (ED-XRFA) is a method for measuring the thickness of coatings and for analysing materials. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coatings and coating systems. In both laboratory and industrial environments, this method is now well established and can be readily utilised with modern equipment.
ED-XRF analysis is a very universal method offering some outstanding advantages. It covers virtually all technically relevant elements and works non-destructively and without contact. Measuring times range in the seconds, rarely longer than one minute. Measurements can be completed quickly and usually without extensive sample preparation. With ED-XRF analysis, it is possible to measure both thickness and chemical composition of homogeneous materials and coatings. Even traces of harmful substances can be detected in the widest variety of samples.